@inproceedings {296,
	title = {Model-based Automatic Test Generation For Event-driven Embedded Systems Using Model Checkers},
	booktitle = {Proc. of Dependability of Computer Systems},
	year = {2006},
	month = {2006},
	pages = {191 - 198},
	publisher = {IEEE Computer Society Press},
	organization = {IEEE Computer Society Press},
	url = {http://doi.ieeecomputersociety.org/10.1109/DEPCOS-RELCOMEX.2006.37},
	author = {Zolt{\'a}n Micskei and Istv{\'a}n Majzik}
}
