Model-based Automatic Test Generation For Event-driven Embedded Systems Using Model Checkers
| Title | Model-based Automatic Test Generation For Event-driven Embedded Systems Using Model Checkers |
| Publication Type | Conference Paper |
| Year of Publication | 2006 |
| Authors | Micskei, Z., and Majzik, I. |
| Conference Name | Proc. of Dependability of Computer Systems |
| Date Published | 2006 |
| Publisher | IEEE Computer Society Press |
| URL | http://doi.ieeecomputersociety.org/10.1109/DEPCOS-RELCOMEX.2006.37 |
