Replaying Execution Trace Models for Dynamic Modeling Languages

CímReplaying Execution Trace Models for Dynamic Modeling Languages
Közlemény típusaJournal Article
Kiadás éve2012
SzerzőkHegedüs, Á., Ráth, I., and Varró, D.
FolyóiratPeriodica Polytechnica-Electrical Engineering
Kötet56
Kiadás3
Pagination71-82
ISSN0324-6000
KulcsszavakIncQuery, Viatra
Összefoglalás

Model repositories based on the Eclipse Modeling Framework (EMF) play a central role in the model-driven development of complex software-intensive systems by offering means to persist and manipulate models obtained from heterogeneous languages and tools.

Complex EMF models can be assembled by interconnecting model fragments by hard links, i.e. regular references, where the target end points to external resources using storage-specific URIs. This approach, in certain application scenarios, may prove to be a too rigid and error prone way of interlinking models. As a flexible alternative, we propose to combine derived features of EMF models with advanced incremental model queries as means for soft interlinking of model elements residing in different model resources. These soft links can be calculated on-demand with graceful handling for temporarily unresolved references. In the background, the interlinks are maintained efficiently and flexibly by using incremental model queries as provided by the EMF-IncQuery framework. While the approach is described over EMF, it is also applicable to other modeling environments or even property graphs for representing query results as first-class relations.

The approach is evaluated in two complex industrial case studies. The first case study is motivated by a knowledge management project from the financial domain, involving a complex interlinked structure of concept and business process models. The second case study is set in the avionics domain with strict traceability requirements enforced by certification standards (DO-178b). It consists of multiple domain models describing the allocation scenario of software functions to hardware components.

URLhttp://periodicapolytechnica.org/ee/article/view/7078
DOI10.3311/PPee.7078
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